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AZtecClean

AZtecClean is the leading global solution for the detection and analysis of particles as part of the technical cleanliness monitoring and investigations commonly performed in the automotive and aerospace industries. 

AZtecClean provides analysts with:

  • Particle analysis fully optimised for technical cleanliness analysis

  • Accurate element identification with AZtec’s TruQ® algorithms

  • Automatic SEM-based data collection, particle classification and reporting to international standards including ISO 16232 and VDA 19 and calculation of component cleanliness codes


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AZtecClean is a tailored version of the AZtecFeature particle analysis platform that is fully optimised for technical cleanliness analysis. The automated SEM based analysis finds, identifies and reports on particles to international standards, such as ISO 16232 and VDA 19.

AZtecClean is specifically designed to meet the analytical requirements of the automotive and aerospace industries and includes dedicated functionalities to ensure that all particles are analysed quickly, easily, and accurately to aid in the process of identifying the sources of contaminants and creating appropriate remedial actions.

AZtecClean uses Oxford Instruments’ Ultim Max or Xplore EDS with the AZtecLive TruQ® algorithms to ensure accurate element identification and quantification, even at the highest levels of throughput.

Montaged image of an entire filter holding detected partcles

Montaged image of an entire filter holding detected partcles

Dedicated

  • Optimised analytical recipe for technical cleanliness
  • Automatically acquires particle data and reports in accordance with ISO 16232 and VDA 19 including the generation of component cleanliness codes
LabelABCDEFGHIJK
Class/Length (μm)<55.0-1515-1525-5050-100100-150150-200200-400400-600600-1000>1000
All Features1861208529249579511161896130300
Ferrous Metals148224116281896343581710100
Steel - Low alloy136206315151781326531610100
Steel - Cr111431009612410000
Steel - High alloy13513195100000
Non-Ferrous Metals1613255262000000
Copper04430000000
Brass17441000000
W12130000000
Ti1210734151000000
CCC=V (B15/C14/D13/E11/F8/G6/H5/I2/JK00)

AZtecClean Classification Table

AZtec Classification - 1
AZtec Classification - 2
AZtec Classification - 3

Includes a dedicated and fully customisable technicl cleanliness classification scheme for the identification of common particles



Flexible

  • Easily add/edit classifications for new particle types
  • Automatically acquire additional data from key particles
  • Terminate analyses automatically when certain criteria are met – e.g. identification of a particular contaminant
  • Perform in depth follow-up investigations of particles within the same software suite
  • Works with a wide range of SEMs 
  • Work with additional analytical techniques in the same software platform (e.g., WDS, EBSD)

Fast

  • Maximum particle analysis rates > 120,000 particles per hour (dependent on hardware configuration)
  • Combine up to 4 Ultim Max detectors for the ultimate in throughput

Accurate

  • Automatically reconstruct large particles broken by field boundaries to ensure correct morphology measurements – essential for the correct calculation of component cleanliness codes

Video

AZtecClean: Setup and Acquisition

This video demonstrates how quick and easy it is to setup and acquire EDS data for technique cleanliness analysis using AZtecClean.

Gallery

By utilising FeaturePhase to analyse the saturated particle in the centre of A, it is possible to determine that two phases (steel & Silicate) within the particle, in B.

(A) Separation of Features that can't be Separated with Backscatter Electron Image (BSE)

By utilising FeaturePhase to analyse the saturated particle in the centre of A, it is possible to determine that two phases (steel & Silicate) within the particle, in B.

(B) Separation of Features that can't be Separated with Backscatter Electron Image (BSE)

By utilising FeaturePhase to analyse the saturated particle (A), it is possible to determine that two phases (steel & silicate) are present within the particle (B).

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