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Symmetry: EBSD Detector

EBSD – electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the microstructural properties of crystalline materials. A high-performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality.

Symmetry is a revolutionary new EBSD detector from Oxford Instruments based on customised CMOS technology, providing unprecedented performance and ease of use:

  • Over 3000 indexed patterns per second (pps)
  • Up to 30x faster than existing CCD-based detectors
  • Extreme sensitivity for low current and low kV analyses
  • 1244 x 1024 pixel resolution, ideal for HR-EBSD applications
  • High resolution patterns at all speeds
  • Innovative design features for simple operation

Symmetry: one detector for all applications with no compromise.

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CMOS SPEED, CMOS Sensitivity, no compromise

 

CMOS SPEED

CMOS SPEED

Operating at over 3000 patterns per second, Symmetry is the world’s fastest EBSD detector. This step-change in performance delivers not only for routine applications, but also for large area mapping, 3D EBSD and in situ experiments.

CMOS SENSITIVITY

CMOS SENSITIVITY

With unparalleled sensitivity and dynamic range, Symmetry is ideal for even the most challenging applications, where low beam currents coupled with fast, high-resolution patterns are a necessity. Now there’s no compromise between speed and sensitivity.

SIMPLICITY

SIMPLICITY

One detector fits all applications: features such as variable tilt, dynamic calibration, automated set-ups and seamless EDS integration ensure that everyone will get the right results every time.

NEW SCIENCE

NEW SCIENCE

Symmetry is a game-changer. Its unprecedented all-round performance will open up exciting new developments in even the most exacting of applications.

Speed & Sensitivity

SYMMETRY CMOS v CCD: SPEED

BREAKTHROUGH TECHNOLOGY

CMOS-based cameras can be both fast and sensitive and are already making a significant impact in other technology fields. Symmetry incorporates a customised CMOS image sensor, optimised for EBSD. It enables a level of performance never achieved by any previous EBSD detector. Whether the focus is on speed or sensitivity, there is no need for compromise.

SYMMETRY CMOS v CCD: APPLICATIONS

THE ‘ONE CHOICE - NO COMPROMISE’ DETECTOR

The unrivalled combination of speed and sensitivity of Symmetry ensures the best performance across a complete range of samples. High acquisition speeds can be achieved without any loss of data quality. Symmetry’s high sensitivity means that, even on more challenging samples such as complex oxides or thin films, an order of magnitude increase in acquisition speed may be achieved with the best possible data quality.

Product Overview

Symmetry device

1 - Optimised phosphor screen

2 - Integrated forescatter detector system

3 - Fast and precise mechanical positioning

4 - Advanced, high-efficiency optics

5 - Bellows SEM interface

6 - Software-controlled tilting interface

7 - Seamless EDS integration

8 - Complete flexibility

9 - Low accelerating voltage operation

10 - Contactless collision sensor

11 - Intuitive camera configurations

12 - High pattern resolution at all speeds

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Product Videos

THE STORY BEHIND SYMMETRY

HIGH RESOLUTION (HR) EBSP

HIGH SPEED ANALYSIS OF NI

SPEED, PROXIMITY, ELEVATION

EBSD Application Notes using Symmetry

Rapid Characterisation of Steel and Ni

In this application note Symmetry is used to characterise a deformed Ni superalloy and a large area across a welded duplex steel.

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High resolution EBSD Mapping of Martensitic Steel

Martensitic structures are traditionally challenging to measure with EBSD. Here, the sensitivity and pattern detail provided by Symmetry enables exceptional results from a martensitic stainless steel.

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Transmission Kikuchi Diffraction (TKD) of metals

Successful TKD analyses require an EBSD detector with both high speed and high sensitivity. The suitability of Symmetry for TKD is demonstrated here on both deformed Al alloys and nanocrystalline Ni.

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Symmetry: High Sensitivity for Beam-sensitive Materials

In this application, Symmetry is used to characterise a challenging biomaterial, shell nacre, and its performance is compared to conventional CCD-based detectors.

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Characterising complex rock samples

An eclogite sample containing 10 phases has been rapidly analysed using integrated EBSD and EDS. The performance of Symmetry enables high pattern resolution and good indexing, even at 250 pps.

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Fast Characterisation of Deformed Quartz Rocks

A relatively simple geological sample, a quartz mylonite, is here characterised in a matter of minutes using Symmetry, collecting data at almost 1000 pps.

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Detailed Study of a Bivalve Shell

An in-depth look at the structures of a mussel shell, characterised using Symmetry. Both calcite and nanostructured aragonite nacre are measured with an unprecedented level of detail and speed.

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Symmetry advantage: high angular resolution at high speeds

This technical bulletin looks at the effect of collecting high resolution patterns at high speeds on metals: astonishing angular resolution, even at 3000 pps.

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Photo gallery

AZtec EBSD Software

AztecHKL Simultaneous EDS Post Processing 3D EBSD EBSD Tutorial

We are renowned for delivering outstanding support. Our global service hubs offer a full range of technical support to keep your detector, system and staff at maximum efficiency.

Keep your investment at peak performance. Multi-layered maintenance contracts suit your operational needs and budget.

Optimising you. Optimising your team. Omni-channel training enables everyone to deliver the right results every time.

Our global network of help desks guarantee a fast local expert response to any application or operational issue.

Our team of accredited support professionals proactively ensure your system is in optimal condition.

We’re with you every step of the way to future proof your investment and ensure onwards data and system compatibility.

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