Products
FIB-SEM
Nanomanipulators
OmniProbeOmniProbe CryoSoftware
AZtec3DAZtecFeatureAZtec LayerProbeTEM
Hardware
EDSUltim MaxXplore for TEMImaging
TEM CamerasSoftware
AZtecTEM
Find more about the new approach for analysis of geological samples using BEX and WDS. Oxford Instrument’s new, high-throughput BEX (Backscattered Electron and X-ray) detector, Unity together with WDS forms a unique combination that gives the best of both worlds; the speed of Unity and the high spectral resolution and detection limits of WDS.
BEX Cartography can be used to quickly and effortlessly map large area of the sample and using that information it is possible to quickly easily locate interesting grains, and gain insight about their distribution. Afterwards WDS can be employed as the best spectral resolution mode to analyse some of the most challenging spectral overlaps, and to perform most precise and sensitive quantitative analysis. With this approach all requirements for analysis of geological samples can be satisfied on single system.
Join us and discover how to:
On Demand
Duration:1 hour
Language:English
Businesses:NanoAnalysis
Dr Lucia Spasevski graduated with a BSc and MSc in Chemistry. She started her career as a Sales and Application specialist for ...
Discover a new and exciting approach for analysing geological samples using Oxford Instrument's new, high-throughput BEX detector, Unity with WDS.