Products

Product Groups (None Selected)

AZtec

AZtec

Relate software

Relate software

EBSD

EBSD

EBSD - Electron Backscatter Diffraction - analysis is a very powerful tool for microstructural characterisation

Backscattered Electron and X-ray (BEX)

Backscattered Electron and X-ray (BEX)

EDS

EDS

Energy Dispersive Spectroscopy (EDS) Analysis provides elemental and chemical analysis of a sample inside the SEM, TEM or FIB.

Ultim Detectors

Ultim Detectors

Xplore

Xplore

Ultim Max Infinity ∞

Ultim Max Infinity ∞

Ultim Extreme Infinity ∞

Ultim Extreme Infinity ∞

XploreCompact for TTM

XploreCompact for TTM

Semicon

Semicon

Excellent peak separation
Accurate trace element analysis
Optimised element detection

Wavelength Dispersive Spectroscopy (WDS)

Wavelength Dispersive Spectroscopy (WDS)

Excellent peak separation
Accurate trace element analysis
Optimised element detection

Nanomanipulators

Nanomanipulators

Effortless Nanoscale Manipulation

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