OmniProbe 200

Features and Benefits

• Includes advanced technology from 8 generations of innovation
• Enable diverse applications from nanowire manipulation to TEM sample preparation to electrical and mechanical measurements
• Move diagonally in ANY direction (omnidirectionality)
• Navigate orthogonally at any sample tilt
• Rapidly orient samples to specific angles
• Perform smooth and precise manipulation over long distances
• Always know where the probe tip is, even when outside the field of view
• Move predictably for all port installations
• Reduce operator fatigue and increase success rates with an easy recall of stored locations
• Avoid collisions
• Pneumatic insertion/retraction links to the microscope software (OEM dependent)
• Built-in capability for applying a bias to the needle ranging up to +/- 10 V, for voltage contrast or other applications.
  
  

Optional Concentric Rotation

Concentrically-corrected rotation with 0.1degree resolution enables the sample to be imaged during rotation at a magnification equivalent to a 60um horizontal field of view.

• Sample rotation is accomplished safely without risk of collision and without constant attention to repositioning the sample or probe tip after each rotation.
• Within a FIB, rotation provides a means for fast and easy tip sharpening to improve electrical characterization or interact with sub-20nm sample features.
  
  

Automation System

• Computer and flat panel monitor
• 2U rack-mounted Ethernet controller
• 3-axis stage with 100nm linear encoder feedback
• Motion control software interface
• User manual and installation guide