OmniProbe 200

The industry-leading PORT MOUNTED nanomanipulators for FIB and SEM instruments include this model integrating 100nm closed-loop encoder feedback control for accuracy, flexibility and ease of use.

Full overview >

Closed-loop system
Patented solution

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Overview
Features

The industry-leading PORT MOUNTED nanomanipulators for FIB and SEM instruments include this model integrating 100nm closed-loop encoder feedback control for accuracy, flexibility and ease of use. Manipulation with a closed-loop system is completely independent of the microscope’s stage positioning, enabling an extra degree of freedom for sample manipulation. Patented solutions leverage this with custom combined stage and probe (CSP) recipes to achieve fast sample repositioning to specific angles.

Features and Benefits

Includes advanced technology from 8 generations of innovation
Enable diverse applications from nanowire manipulation to TEM sample preparation to electrical and mechanical measurements
Move diagonally in ANY direction (omnidirectionality)
Navigate orthogonally at any sample tilt
Rapidly orient samples to specific angles
Perform smooth and precise manipulation over long distances
Always know where the probe tip is, even when outside the field of view
Move predictably for all port installations
Reduce operator fatigue and increase success rates with an easy recall of stored locations
Avoid collisions
Pneumatic insertion/retraction links to the microscope software (OEM dependent)
Built-in capability for applying a bias to the needle ranging up to +/- 10 V, for voltage contrast or other applications.

Optional Concentric Rotation

Concentrically-corrected rotation with 0.1degree resolution enables the sample to be imaged during rotation at a magnification equivalent to a 60um horizontal field of view.

Sample rotation is accomplished safely without risk of collision and without constant attention to repositioning the sample or probe tip after each rotation.
Within a FIB, rotation provides a means for fast and easy tip sharpening to improve electrical characterization or interact with sub-20nm sample features.

Automation System

Computer and flat panel monitor
2U rack-mounted Ethernet controller
3-axis stage with 100nm linear encoder feedback
Motion control software interface
User manual and installation guide

Options

Optional Concentric Rotation

Concentrically-corrected rotation with 0.1degree resolution enables the sample to be imaged during rotation at a magnification equivalent to a 60um horizontal field of view.
Sample rotation is accomplished safely without risk of collision and without constant attention to repositioning the sample or probe tip after each rotation.
Within a FIB, rotation provides a means for fast and easy tip sharpening to improve electrical characterization or interact with sub-20nm sample features.

Automation System