OmniProbe 400

Accuracy

Nanometre-resolution piezo actuators and 10nm closed-loop encoders provide industry-leading precision, linearity and smooth motion

Speed

Automation on multiple levels enables results in the fewest steps possible

• Insertion repeatability eliminates tip realignment
• Change tips in 3 minutes without venting
• Concentric rotation enables rapid tip sharpening, tip cleaning, and sample repositioning
• Safely and precisely navigate to stored positions close to the sample and back to park
  
  

Accurate closed-loop feedback control

The OmniProbe 400 uses a closed-loop control to deliver smooth motion, dependable accuracy, and a high degree of integration. In addition to very high motion resolution, the OmniProbe 400 integrates motorized concentric rotation and fast in situ tip changes as standard:

• Non-pneumatic insertion and retraction is gentle to fragile samples
• Move with high accuracy, linearity and repeatability
• Move diagonally in ANY direction (omnidirectionality)
• Navigate orthogonally at any sample tilt
• Rapidly orient samples to specific angles
• Perform smooth and precise manipulation over long distances
• Always know where the probe tip is, even when outside the field of view
• Move predictably for all port installations
• Use fixed and user-programmable positions to reduce operator fatigue and increase success rates
• Avoid collisions
• Rotate concentrically
• Change tips in situ
  
  

In-situ tip change

• Probe needles can be replaced in under 3 minutes without venting the microscope
• Atmospheric contamination is avoided and the high vacuum preserved for the best performance
• Samples attached to tips can be safely stored for later use, allowing multiple users to maintain their throughput
  
  

Concentric rotation

The tip stays in the field of view for rapid tip shaping and sample reorienting without risk of sample loss or accidental venting.

• Position with sub-degree accuracy
• Extend the needle life
• Create fine tips exhibiting ohmic behaviour
• Prepare micro tips for nanoparticle manipulations that use Van der Waals forces
• Reorient samples for plan-view, side-view and backside preparations